Gate oxide protection in HV CMOS/DMOS integrated circuits: Design and experimental results - researchr publication authors

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Robert Chebli, Mohamad Sawan, Yvon Savaria. Gate oxide protection in HV CMOS/DMOS integrated circuits: Design and experimental results. In 12th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2005, Gammarth, Tunisia, December 11-14, 2005. pages 1-4, IEEE, 2005. [doi]

This author has not been identified. Look up 'Robert Chebli' in GoogleThis author has not been identified. Look up 'Mohamad Sawan' in GoogleThis author has not been identified. Look up 'Yvon Savaria' in Google

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