Robert Chebli, Mohamad Sawan, Yvon Savaria. Gate oxide protection in HV CMOS/DMOS integrated circuits: Design and experimental results. In 12th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2005, Gammarth, Tunisia, December 11-14, 2005. pages 1-4, IEEE, 2005. [doi]
@inproceedings{ChebliSS05,
title = {Gate oxide protection in HV CMOS/DMOS integrated circuits: Design and experimental results},
author = {Robert Chebli and Mohamad Sawan and Yvon Savaria},
year = {2005},
doi = {10.1109/ICECS.2005.4633435},
url = {http://dx.doi.org/10.1109/ICECS.2005.4633435},
researchr = {https://researchr.org/publication/ChebliSS05},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {12th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2005, Gammarth, Tunisia, December 11-14, 2005},
publisher = {IEEE},
isbn = {978-9972-61-100-1},
}