Natalia V. Chebykina, Sergey G. Mosin. A technique of optimal built-in self-test circuitries generation. In 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010. pages 145-148, IEEE, 2010. [doi]
@inproceedings{ChebykinaM10,
title = {A technique of optimal built-in self-test circuitries generation},
author = {Natalia V. Chebykina and Sergey G. Mosin},
year = {2010},
doi = {10.1109/EWDTS.2010.5742133},
url = {http://doi.ieeecomputersociety.org/10.1109/EWDTS.2010.5742133},
researchr = {https://researchr.org/publication/ChebykinaM10},
cites = {0},
citedby = {0},
pages = {145-148},
booktitle = {2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010},
publisher = {IEEE},
isbn = {978-1-4244-9555-9},
}