An Optical Boundary Scan Cell for On Line Testing of Embedded Systems - researchr publication authors

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Hamimi Chemali, Abdelhakim Latoui, Chouki Aktouf. An Optical Boundary Scan Cell for On Line Testing of Embedded Systems. In Hamid R. Arabnia, Laurence Tianruo Yang, editors, Proceedings of the International Conference on Embedded Systems and Applications, ESA 03, June 23 - 26, 2003, Las Vegas, Nevada, USA. pages 155-160, CSREA Press, 2003.

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