An Optical Boundary Scan Cell for On Line Testing of Embedded Systems

Hamimi Chemali, Abdelhakim Latoui, Chouki Aktouf. An Optical Boundary Scan Cell for On Line Testing of Embedded Systems. In Hamid R. Arabnia, Laurence Tianruo Yang, editors, Proceedings of the International Conference on Embedded Systems and Applications, ESA 03, June 23 - 26, 2003, Las Vegas, Nevada, USA. pages 155-160, CSREA Press, 2003.

@inproceedings{ChemaliLA03,
  title = {An Optical Boundary Scan Cell for On Line Testing of Embedded Systems},
  author = {Hamimi Chemali and Abdelhakim Latoui and Chouki Aktouf},
  year = {2003},
  tags = {testing},
  researchr = {https://researchr.org/publication/ChemaliLA03},
  cites = {0},
  citedby = {0},
  pages = {155-160},
  booktitle = {Proceedings of the International Conference on Embedded Systems and Applications, ESA  03, June 23 - 26, 2003, Las Vegas, Nevada, USA},
  editor = {Hamid R. Arabnia and Laurence Tianruo Yang},
  publisher = {CSREA Press},
  isbn = {1-932415-05-X},
}