Harry H. Chen. Perspectives on Test Data Mining from Industrial Experience. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 242-247, IEEE Computer Society, 2014. [doi]
@inproceedings{Chen14-102, title = {Perspectives on Test Data Mining from Industrial Experience}, author = {Harry H. Chen}, year = {2014}, doi = {10.1109/ATS.2014.52}, url = {http://dx.doi.org/10.1109/ATS.2014.52}, researchr = {https://researchr.org/publication/Chen14-102}, cites = {0}, citedby = {0}, pages = {242-247}, booktitle = {23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014}, publisher = {IEEE Computer Society}, isbn = {978-1-4799-6030-9}, }