C. Q. Chen, G. B. Ang, P. T. Ng, Francis Rivai, H. P. Ng, A. C. T. Quah, Angela Teo, Jeffery Lam, Z. H. Mai. Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis. Microelectronics Reliability, 76:261-266, 2017. [doi]
Abstract is missing.