Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter Wavelengths

Shu Chen, Mohammed N. Afsar, D. Sakdatorn. Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter Wavelengths. IEEE T. Instrumentation and Measurement, 57(4):706-715, 2008. [doi]

Authors

Shu Chen

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Mohammed N. Afsar

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D. Sakdatorn

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