Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter Wavelengths

Shu Chen, Mohammed N. Afsar, D. Sakdatorn. Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter Wavelengths. IEEE T. Instrumentation and Measurement, 57(4):706-715, 2008. [doi]

Abstract

Abstract is missing.