Xinghao Chen, Michael L. Bushnell. Sequential circuit test generation using dynamic justification equivalence. J. Electronic Testing, 8(1):9-33, 1996. [doi]
@article{ChenB96:1,
title = {Sequential circuit test generation using dynamic justification equivalence},
author = {Xinghao Chen and Michael L. Bushnell},
year = {1996},
doi = {10.1007/BF00136073},
url = {http://dx.doi.org/10.1007/BF00136073},
tags = {testing},
researchr = {https://researchr.org/publication/ChenB96%3A1},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {8},
number = {1},
pages = {9-33},
}