Low-Overhead Triple-Node-Upset-Tolerant Latch Design in 28-nm CMOS

Xin Chen, Yuxin Bai, Jianpeng Cao, Lei Wang, Xinjie Zhou, Ying Zhang, Weiqiang Liu 0001. Low-Overhead Triple-Node-Upset-Tolerant Latch Design in 28-nm CMOS. IEEE Trans. VLSI Syst., 31(7):1039-1050, 2023. [doi]

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