Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
F. Chen, O. Bravo, D. Harmon, M. Shinosky, J. Aitken. Cu/low-k dielectric TDDB reliability issues for advanced CMOS technologies. Microelectronics Reliability, 48(8-9):1375-1383, 2008. [doi]
Abstract is missing.