Chun Yueh Chen, Kuohsiang Chen. Application of the Labeled Magnitude Scale in Kansei Research. In Nuray M. Aykin, editor, Internationalization, Design and Global Development, Third International Conference, IDGD 2009, Held as Part of HCI International 2009, San Diego, CA, USA, July 19-24, 2009. Proceedings. Volume 5623 of Lecture Notes in Computer Science, pages 219-227, Springer, 2009. [doi]
Abstract is missing.