Native-conflict-aware wire perturbation for double patterning technology

Szu-Yu Chen, Yao-Wen Chang. Native-conflict-aware wire perturbation for double patterning technology. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 556-561, IEEE, 2010. [doi]

Authors

Szu-Yu Chen

This author has not been identified. Look up 'Szu-Yu Chen' in Google

Yao-Wen Chang

This author has not been identified. Look up 'Yao-Wen Chang' in Google