Robust spatially sampled controller design for banding reduction in electrophotographic process - researchr publication authors

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Cheng-Lun Chen, George T.-C. Chiu, Jan P. Allebach. Robust spatially sampled controller design for banding reduction in electrophotographic process. In Proceedings of the 2003 IEEE International Conference on Robotics and Automation, ICRA 2003, September 14-19, 2003, Taipei, Taiwan. pages 2622-2627, IEEE, 2003.

This author has not been identified. Look up 'Cheng-Lun Chen' in GoogleThis author has not been identified. Look up 'George T.-C. Chiu' in GoogleThis author has not been identified. Look up 'Jan P. Allebach' in Google

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