Cheng-Lun Chen, George T.-C. Chiu, Jan P. Allebach. Robust spatially sampled controller design for banding reduction in electrophotographic process. In Proceedings of the 2003 IEEE International Conference on Robotics and Automation, ICRA 2003, September 14-19, 2003, Taipei, Taiwan. pages 2622-2627, IEEE, 2003.
Abstract is missing.