Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction

Linfeng Chen, Aijiao Cui, Chip-Hong Chang. Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction. IEEE Transactions on Computers, 64(12):3417-3429, 2015. [doi]

Authors

Linfeng Chen

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Aijiao Cui

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Chip-Hong Chang

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