Linfeng Chen, Aijiao Cui, Chip-Hong Chang. Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction. IEEE Transactions on Computers, 64(12):3417-3429, 2015. [doi]
@article{ChenCC15-4,
title = {Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction},
author = {Linfeng Chen and Aijiao Cui and Chip-Hong Chang},
year = {2015},
doi = {10.1109/TC.2015.2401019},
url = {http://doi.ieeecomputersociety.org/10.1109/TC.2015.2401019},
researchr = {https://researchr.org/publication/ChenCC15-4},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {64},
number = {12},
pages = {3417-3429},
}