High thermal stability and low hysteresis dispersion AlGaN/GaN MOS-HEMTs with zirconia film design

Chao-Hung Chen, Hsien-Chin Chiu, Feng-Tso Chien, Hao-Wei Chuang, Kuo-Jen Chang, Yau-Tang Gau. High thermal stability and low hysteresis dispersion AlGaN/GaN MOS-HEMTs with zirconia film design. Microelectronics Reliability, 52(11):2551-2555, 2012. [doi]

Abstract

Abstract is missing.