Harry H. Chen, Simon Y.-H. Chen, Po-Yao Chuang, Cheng-Wen Wu. Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 197-202, IEEE Computer Society, 2016. [doi]
@inproceedings{ChenCCW16-1,
title = {Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation},
author = {Harry H. Chen and Simon Y.-H. Chen and Po-Yao Chuang and Cheng-Wen Wu},
year = {2016},
doi = {10.1109/ATS.2016.33},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.33},
researchr = {https://researchr.org/publication/ChenCCW16-1},
cites = {0},
citedby = {0},
pages = {197-202},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}