Harry H. Chen, Simon Y.-H. Chen, Po-Yao Chuang, Cheng-Wen Wu. Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 197-202, IEEE Computer Society, 2016. [doi]
Abstract is missing.