Reproducibility of transmission line measurement of bipolar I-V characteristics of MOSFETs

T. P. Chen, R. Chan, S. Fung, K. F. Lo. Reproducibility of transmission line measurement of bipolar I-V characteristics of MOSFETs. IEEE T. Instrumentation and Measurement, 48(3):721-723, 1999. [doi]

Authors

T. P. Chen

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R. Chan

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S. Fung

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K. F. Lo

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