Reproducibility of transmission line measurement of bipolar I-V characteristics of MOSFETs

T. P. Chen, R. Chan, S. Fung, K. F. Lo. Reproducibility of transmission line measurement of bipolar I-V characteristics of MOSFETs. IEEE T. Instrumentation and Measurement, 48(3):721-723, 1999. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.