Improved on-chip self-triggered single-event transient measurement circuit design and applications

Rongmei Chen, Wei Chen, Xiaoqiang Guo, Chen Shen, Fengqi Zhang, Lisang Zheng, Wen Zhao, Lili Ding, Yinhong Luo, Hongxia Guo, Yuanming Wang, Yinong Liu. Improved on-chip self-triggered single-event transient measurement circuit design and applications. Microelectronics Reliability, 71:99-105, 2017. [doi]

Abstract

Abstract is missing.