Radiation hardened by design techniques to reduce single event transient pulse width based on the physical mechanism - researchr publication authors

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Jianjun Chen, Shuming Chen, Bin Liang, Biwei Liu, Fanyu Liu. Radiation hardened by design techniques to reduce single event transient pulse width based on the physical mechanism. Microelectronics Reliability, 52(6):1227-1232, 2012. [doi]

This author has not been identified. Look up 'Jianjun Chen' in GoogleThis author has not been identified. Look up 'Shuming Chen' in GoogleThis author has not been identified. Look up 'Bin Liang' in GoogleThis author has not been identified. Look up 'Biwei Liu' in GoogleThis author has not been identified. Look up 'Fanyu Liu' in Google

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