Jianjun Chen, Shuming Chen, Bin Liang, Biwei Liu, Fanyu Liu. Radiation hardened by design techniques to reduce single event transient pulse width based on the physical mechanism. Microelectronics Reliability, 52(6):1227-1232, 2012. [doi]
@article{ChenCLLL12,
title = {Radiation hardened by design techniques to reduce single event transient pulse width based on the physical mechanism},
author = {Jianjun Chen and Shuming Chen and Bin Liang and Biwei Liu and Fanyu Liu},
year = {2012},
doi = {10.1016/j.microrel.2011.12.002},
url = {http://dx.doi.org/10.1016/j.microrel.2011.12.002},
researchr = {https://researchr.org/publication/ChenCLLL12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {6},
pages = {1227-1232},
}