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An Erase Efficiency Boosting Strategy for 3D Charge Trap NAND Flash

Shuo-Han Chen, Yuan-Hao Chang, Yu-Pei Liang, Hsin-Wen Wei, Wei Kuan Shih. An Erase Efficiency Boosting Strategy for 3D Charge Trap NAND Flash. IEEE Transactions on Computers, 67(9):1246-1258, 2018. [doi]

Authors

Shuo-Han Chen

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Yuan-Hao Chang

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Yu-Pei Liang

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Hsin-Wen Wei

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Wei Kuan Shih

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