Multiple classifier systems combined with localized generalization error for fault diagnosis of power transformers

Wei-Chun Chen, Patrick P. K. Chan, Wing W. Y. Ng, Daniel S. Yeung. Multiple classifier systems combined with localized generalization error for fault diagnosis of power transformers. In International Conference on Machine Learning and Cybernetics, ICMLC 2010, Qingdao, China, July 11-14, 2010, Proceedings. pages 1464-1469, IEEE, 2010. [doi]

Authors

Wei-Chun Chen

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Patrick P. K. Chan

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Wing W. Y. Ng

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Daniel S. Yeung

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