Wei-Chun Chen, Patrick P. K. Chan, Wing W. Y. Ng, Daniel S. Yeung. Multiple classifier systems combined with localized generalization error for fault diagnosis of power transformers. In International Conference on Machine Learning and Cybernetics, ICMLC 2010, Qingdao, China, July 11-14, 2010, Proceedings. pages 1464-1469, IEEE, 2010. [doi]
@inproceedings{ChenCNY10-0,
title = {Multiple classifier systems combined with localized generalization error for fault diagnosis of power transformers},
author = {Wei-Chun Chen and Patrick P. K. Chan and Wing W. Y. Ng and Daniel S. Yeung},
year = {2010},
doi = {10.1109/ICMLC.2010.5580838},
url = {http://dx.doi.org/10.1109/ICMLC.2010.5580838},
researchr = {https://researchr.org/publication/ChenCNY10-0},
cites = {0},
citedby = {0},
pages = {1464-1469},
booktitle = {International Conference on Machine Learning and Cybernetics, ICMLC 2010, Qingdao, China, July 11-14, 2010, Proceedings},
publisher = {IEEE},
}