An Extension of Sine-Sinc Model Based on Logarithm of Likelihood

Fuhua Chen, Yunmei Chen, Hemant Tagare. An Extension of Sine-Sinc Model Based on Logarithm of Likelihood. In Hamid R. Arabnia, editor, Proceedings of the 2008 International Conference on Image Processing, Computer Vision, & Pattern Recognition, IPCV 2008, July 14-17, 2008, Las Vegas Nevada, USA, 2 Volumes. pages 222-227, CSREA Press, 2008.

Abstract

Abstract is missing.