The Influence of the Block Design on the ID-VD Curves of Power Transistor for E-SOA Characterization

Chun-Chih Chen, Shih-Chieh Chien, Chien-Wei Wang, Yu-Sheng Chiu, Jung-Tsun Chuang, Li-Fan Chen, Chieh-Yao Chuang, Jian-Hsing Lee. The Influence of the Block Design on the ID-VD Curves of Power Transistor for E-SOA Characterization. In International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2024, Taichung, Taiwan, July 9-11, 2024. pages 779-780, IEEE, 2024. [doi]

Abstract

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