Jinfu Chen 0001, Haibo Chen 0005, Yiming Wu, Chengying Mao, Saihua Cai. Adaptive Random Testing based on the Modified Metric-memory Tree and Information Entropy. In 9th International Conference on Dependable Systems and Their Applications, DSA 2022, Wulumuqi, China, August 4-5, 2022. pages 615-623, IEEE, 2022. [doi]
Abstract is missing.