Research on insulator image segmentation and defect recognition technology based on U-Net and YOLOv7

Jiawen Chen, Chao Cai, Fangbin Yan, Bowen Zhou. Research on insulator image segmentation and defect recognition technology based on U-Net and YOLOv7. Concurrency - Practice and Experience, 36(25), November 2024. [doi]

Abstract

Abstract is missing.