Li Chen, Sujit Dey. DEFUSE: A Deterministic Functional Self-Test Methodology for Processors. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 255-262, IEEE Computer Society, 2000. [doi]
@inproceedings{ChenD00:2,
title = {DEFUSE: A Deterministic Functional Self-Test Methodology for Processors},
author = {Li Chen and Sujit Dey},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/vts/2000/0613/00/06130255abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/ChenD00%3A2},
cites = {0},
citedby = {0},
pages = {255-262},
booktitle = {18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada},
publisher = {IEEE Computer Society},
isbn = {0-7695-0613-5},
}