Conformation of EPC Class 1 Generation 2 standards RFID system with mutual authentication and privacy protection

Chin-Ling Chen, Yong-Yuan Deng. Conformation of EPC Class 1 Generation 2 standards RFID system with mutual authentication and privacy protection. Eng. Appl. of AI, 22(8):1284-1291, 2009. [doi]

Abstract

Abstract is missing.