Yin-Nien Chen, Ming-Long Fan, Vita Pi-Ho Hu, Ming-Fu Tsai, Chia-Hao Pao, Pin Su, Ching-Te Chuang. A comparative analysis of tunneling FET circuit switching characteristics and SRAM stability and performance. In Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012. pages 157-160, IEEE, 2012. [doi]
Abstract is missing.