Yanbin Chen, Innocenzo Fulginiti, Christian B. Mendl. Reducing Mid-Circuit Measurements via Probabilistic Circuits. In Marek Osinski, Brian La Cour, Lia Yeh, editors, IEEE International Conference on Quantum Computing and Engineering, QCE 2024, Montreal, QC, Canada, September 15-20, 2024. pages 952-958, IEEE, 2024. [doi]
Abstract is missing.