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Reliability Assessment of Light-Emitting Diode Packages With Both Luminous Flux Response Surface Model and Spectral Power Distribution Method

Wei Chen, Jiajie Fan, Cheng Qian 0003, Bin Pu, Xuejun Fan, Guoqi Zhang. Reliability Assessment of Light-Emitting Diode Packages With Both Luminous Flux Response Surface Model and Spectral Power Distribution Method. IEEE Access, 7:68495-68502, 2019. [doi]

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