Liang-Chi Chen, Sandeep K. Gupta, Melvin A. Breuer. High Quality Robust Tests for Path Delay Faults. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 88-93, IEEE Computer Society, 1997. [doi]
Abstract is missing.