Multibit Retention Registers for Power Gated Designs: Concept, Design, and Deployment - researchr publication authors

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Yu-Guang Chen, Hui Geng, Kuan-Yu Lai, Yiyu Shi, Shih-Chieh Chang. Multibit Retention Registers for Power Gated Designs: Concept, Design, and Deployment. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(4):507-518, 2014. [doi]

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