Jinyin Chen, Keke Hu, Yue Yu 0001, Zhuangzhi Chen, Qi Xuan, Yi Liu 0024, Vladimir Filkov. Software visualization and deep transfer learning for effective software defect prediction. In Gregg Rothermel, Doo-Hwan Bae, editors, ICSE '20: 42nd International Conference on Software Engineering, Seoul, South Korea, 27 June - 19 July, 2020. pages 578-589, ACM, 2020. [doi]
Abstract is missing.