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A Histogram-based Outlier Profile for Atomic Structures Derived from Cryo-Electron Microscopy

Lin Chen, Jing He. A Histogram-based Outlier Profile for Atomic Structures Derived from Cryo-Electron Microscopy. In Xinghua Mindy Shi, Michael Buck, Jian Ma 0004, Pierangelo Veltri, editors, Proceedings of the 10th ACM International Conference on Bioinformatics, Computational Biology and Health Informatics, BCB 2019, Niagara Falls, NY, USA, September 7-10, 2019. pages 586-591, ACM, 2019. [doi]

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Lin Chen

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Jing He

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