A Histogram-based Outlier Profile for Atomic Structures Derived from Cryo-Electron Microscopy

Lin Chen, Jing He. A Histogram-based Outlier Profile for Atomic Structures Derived from Cryo-Electron Microscopy. In Xinghua Mindy Shi, Michael Buck, Jian Ma 0004, Pierangelo Veltri, editors, Proceedings of the 10th ACM International Conference on Bioinformatics, Computational Biology and Health Informatics, BCB 2019, Niagara Falls, NY, USA, September 7-10, 2019. pages 586-591, ACM, 2019. [doi]

@inproceedings{ChenH19-33,
  title = {A Histogram-based Outlier Profile for Atomic Structures Derived from Cryo-Electron Microscopy},
  author = {Lin Chen and Jing He},
  year = {2019},
  doi = {10.1145/3307339.3343865},
  url = {https://doi.org/10.1145/3307339.3343865},
  researchr = {https://researchr.org/publication/ChenH19-33},
  cites = {0},
  citedby = {0},
  pages = {586-591},
  booktitle = {Proceedings of the 10th ACM International Conference on Bioinformatics, Computational Biology and Health Informatics, BCB 2019, Niagara Falls, NY, USA, September 7-10, 2019},
  editor = {Xinghua Mindy Shi and Michael Buck and Jian Ma 0004 and Pierangelo Veltri},
  publisher = {ACM},
  isbn = {978-1-4503-6666-3},
}