Zhentao Chen, Junlin Hu. Intra-variance Guided Metric Learning for Face Forgery Detection. In Wei Jia, Wenxiong Kang, Zaiyu Pan, Xianye Ben, Zhengfu Bian, Shiqi Yu 0001, Zhaofeng He, Jun Wang, editors, Biometric Recognition - 17th Chinese Conference, CCBR 2023, Xuzhou, China, December 1-3, 2023, Proceedings. Volume 14463 of Lecture Notes in Computer Science, pages 140-149, Springer, 2023. [doi]
@inproceedings{ChenH23-36,
title = {Intra-variance Guided Metric Learning for Face Forgery Detection},
author = {Zhentao Chen and Junlin Hu},
year = {2023},
doi = {10.1007/978-981-99-8565-4_14},
url = {https://doi.org/10.1007/978-981-99-8565-4_14},
researchr = {https://researchr.org/publication/ChenH23-36},
cites = {0},
citedby = {0},
pages = {140-149},
booktitle = {Biometric Recognition - 17th Chinese Conference, CCBR 2023, Xuzhou, China, December 1-3, 2023, Proceedings},
editor = {Wei Jia and Wenxiong Kang and Zaiyu Pan and Xianye Ben and Zhengfu Bian and Shiqi Yu 0001 and Zhaofeng He and Jun Wang},
volume = {14463},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-981-99-8565-4},
}