Zhentao Chen, Junlin Hu. Intra-variance Guided Metric Learning for Face Forgery Detection. In Wei Jia, Wenxiong Kang, Zaiyu Pan, Xianye Ben, Zhengfu Bian, Shiqi Yu 0001, Zhaofeng He, Jun Wang, editors, Biometric Recognition - 17th Chinese Conference, CCBR 2023, Xuzhou, China, December 1-3, 2023, Proceedings. Volume 14463 of Lecture Notes in Computer Science, pages 140-149, Springer, 2023. [doi]
Abstract is missing.