Design and Impact on ESD/LU Immunities by Drain-Side Super-Junction Structures in Low-(High-)Voltage MOSFETs for the Power Applications

Shen-Li Chen, Yu-Ting Huang, Shawn Chang. Design and Impact on ESD/LU Immunities by Drain-Side Super-Junction Structures in Low-(High-)Voltage MOSFETs for the Power Applications. IEICE Transactions, 101-C(3):143-150, 2018. [doi]

Abstract

Abstract is missing.