Shing-Yu Chen, Ming-Yi Hsiao, Wen-Ben Jone, Tien-Fu Chen. A configurable bus-tracer for error reproduction in post-silicon validation. In 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013. pages 1-4, IEEE, 2013. [doi]
@inproceedings{ChenHJC13,
title = {A configurable bus-tracer for error reproduction in post-silicon validation},
author = {Shing-Yu Chen and Ming-Yi Hsiao and Wen-Ben Jone and Tien-Fu Chen},
year = {2013},
doi = {10.1109/VLDI-DAT.2013.6533823},
url = {http://dx.doi.org/10.1109/VLDI-DAT.2013.6533823},
researchr = {https://researchr.org/publication/ChenHJC13},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013},
publisher = {IEEE},
isbn = {978-1-4673-4435-7},
}