Tsong Yueh Chen, Dehao Huang, Fei-Ching Kuo, Robert G. Merkel, Johannes Mayer. Enhanced lattice-based adaptive random testing. In Sung Y. Shin, Sascha Ossowski, editors, Proceedings of the 2009 ACM Symposium on Applied Computing (SAC), Honolulu, Hawaii, USA, March 9-12, 2009. pages 422-429, ACM, 2009. [doi]
@inproceedings{ChenHKMM09, title = {Enhanced lattice-based adaptive random testing}, author = {Tsong Yueh Chen and Dehao Huang and Fei-Ching Kuo and Robert G. Merkel and Johannes Mayer}, year = {2009}, doi = {10.1145/1529282.1529376}, url = {http://doi.acm.org/10.1145/1529282.1529376}, tags = {rule-based, testing, random testing}, researchr = {https://researchr.org/publication/ChenHKMM09}, cites = {0}, citedby = {0}, pages = {422-429}, booktitle = {Proceedings of the 2009 ACM Symposium on Applied Computing (SAC), Honolulu, Hawaii, USA, March 9-12, 2009}, editor = {Sung Y. Shin and Sascha Ossowski}, publisher = {ACM}, isbn = {978-1-60558-166-8}, }