Tsong Yueh Chen, Dehao Huang, Fei-Ching Kuo, Robert G. Merkel, Johannes Mayer. Enhanced lattice-based adaptive random testing. In Sung Y. Shin, Sascha Ossowski, editors, Proceedings of the 2009 ACM Symposium on Applied Computing (SAC), Honolulu, Hawaii, USA, March 9-12, 2009. pages 422-429, ACM, 2009. [doi]
Abstract is missing.