Pushing the Limit of Fine-Tuning for Few-Shot Learning: Where Feature Reusing Meets Cross-Scale Attention

Ying-Yu Chen, Jun-Wei Hsieh, Xin Li, Ming-Ching Chang. Pushing the Limit of Fine-Tuning for Few-Shot Learning: Where Feature Reusing Meets Cross-Scale Attention. In Michael J. Wooldridge, Jennifer G. Dy, Sriraam Natarajan, editors, Thirty-Eigth AAAI Conference on Artificial Intelligence, AAAI 2024, Thirty-Sixth Conference on Innovative Applications of Artificial Intelligence, IAAI 2024, Fourteenth Symposium on Educational Advances in Artificial Intelligence, EAAI 2014, February 20-27, 2024, Vancouver, Canada. pages 11434-11442, AAAI Press, 2024. [doi]

@inproceedings{ChenHLC24,
  title = {Pushing the Limit of Fine-Tuning for Few-Shot Learning: Where Feature Reusing Meets Cross-Scale Attention},
  author = {Ying-Yu Chen and Jun-Wei Hsieh and Xin Li and Ming-Ching Chang},
  year = {2024},
  doi = {10.1609/aaai.v38i10.29024},
  url = {https://doi.org/10.1609/aaai.v38i10.29024},
  researchr = {https://researchr.org/publication/ChenHLC24},
  cites = {0},
  citedby = {0},
  pages = {11434-11442},
  booktitle = {Thirty-Eigth AAAI Conference on Artificial Intelligence, AAAI 2024, Thirty-Sixth Conference on Innovative Applications of Artificial Intelligence, IAAI 2024, Fourteenth Symposium on Educational Advances in Artificial Intelligence, EAAI 2014, February 20-27, 2024, Vancouver, Canada},
  editor = {Michael J. Wooldridge and Jennifer G. Dy and Sriraam Natarajan},
  publisher = {AAAI Press},
}